Dr. JKR Sastry, Dr A Vinaya, Smt. J Sasi Bhanu, Dept of CSE have authored a paper was published in International Journal of Advances in Science and Technology
Embedded systems require rigorous testing as any bug occurring in the embedded system will fail the entire system as whole. Detecting the reason for the bug and rectifying the bug is not possible as it is not easy to simulate the occurrence of the bug again either offline or online. The testing of the embedded systems must be done in a faster manner so that cost of testing is reduced. Comprehensive Testing of embedded systems requires that testing of hardware, software and the integration of both must be carried. Different Kinds of testing should also be carried which include, module testing, functional testing, integration testing, regression testing and component testing to ensure that the embedded systems are designed and developed properly and that all eventual events are handled properly. Comprehensive testing of the embedded systems requires building efficient repositories that forms the basis for carrying the testing
In this paper a data model is suggested using which all kinds of testing of embedded systems can be carried. The model proposed shall help automating the process of test case generation, conducting coverage analysis, traceability analysis and ripple effect analysis which help conducting comprehensive, and complete testing in a very faster manner and help reducing the cost of testing of an embedded systems as low as possible.
Keywords: Testing Embedded systems, Process models, Data models, Comprehensive Testing,