Dr. JKR Sastry, Dr A Vinaya, Smt. J Sasi Bhanu, Dept of CSE have authored a paper was published in International Journal of Computer Information Systems


Abstract: 
Embedded systems require rigorous testing as any bug occurring in the embedded system will fail the entire system as whole. Detecting the reason for the bug and rectifying the bug is not possible as it is not easy to simulate the occurrence of the bug again either offline or online. The testing of the embedded systems must be done in a faster manner so that cost of testing is reduced. Scenario based testing has been proposed using which systematic testing can be carried including the test case generation, test coverage analysis, and carrying the regression testing. The model concentrates on testing the software aspects of an embedded system. Testing of embedded systems as such involves testing the Hardware, testing the software and testing the software along with Hardware. Testing the software alone will not be sufficient to declare an embedded system as bug Free This paper proposes process models incorporating the scenarios based models to carry comprehensive testing of embedded systems. Various process models have been suggested using which comprehensive testing can be carried.
Keywords: Testing embedded systems, Comprehensive Models, Process models. Hardware Testing, Software Testing